The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Oct. 03, 2000

Filed:

Dec. 10, 1997
Applicant:
Inventor:

Mehmet Ali Tan, Irvine, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324619 ; 324618 ;
Abstract

A method and apparatus for determining the center frequency of a bandpass filter. The center frequency of a bandpass filter is determined by applying a bias voltage to a bandpass filter circuit receiving a pair of differential input voltages and producing a pair of differential output voltages. The differential output voltages are modified to exhibit a notchband magnitude characteristic. A minimum value of the differential output voltages exhibiting the notchband characteristic over a predetermined range of frequencies is determined and corresponds to the center frequency of the bandpass filter.


Find Patent Forward Citations

Tan, Mehmet. (2000). Method and apparatus for the efficient test of the center frequency of (U.S. Patent No. 6127829). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6127829

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

Loading…