The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Oct. 03, 2000
Filed:
May. 11, 1999
Applicant:
Inventors:
Melvin Schweitzer, Port Washington, NY (US);
Walter K Feldman, Smithtown, NY (US);
William F Konig, Manhasset, NY (US);
Daniel J DiFrancesco, North Tonawanda, NY (US);
David L Sieracki, Depew, NY (US);
Carlo P San Giovanni, Commack, NY (US);
Assignee:
Lockheed Martin Corporation, Bethesda, MD (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01V / ;
U.S. Cl.
CPC ...
7338 / ; 702-2 ;
Abstract
Gravity gradient measurements taken by an accelerometer type gradiometer are optimized by tilting the measuring plane of the instrument by a selected angle above and below the horizontal to obtain data that can be differenced or otherwise processed to remove instrument bias and by taking data at first and then at a second orthogonal azimuth heading to obtain absolute non-relative gradient measurements.