The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 26, 2000

Filed:

Jul. 13, 1998
Applicant:
Inventor:

Keiji Hida, Hannan, JP;

Assignee:

Noritsu Koki Co., Ltd., Wakayama, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G03B / ; G03B / ;
U.S. Cl.
CPC ...
355 40 ; 396119 ;
Abstract

A method for judging an occurrence of an error when reading magnetic data obtained by scanning magnetic recording portions provided in conformity with the respective frames of a photographic film F by a magnetic data reader. The method comprises detecting whether or not a read state of the magnetic data has changed between successive frames, counting the number of changes in the read state and judging whether or not a data read error has occurred by comparing a count value with a judgment reference number.


Find Patent Forward Citations

Hida, Keiji. (2000). Method and apparatus for judging an error in reading data recorded in a (U.S. Patent No. 6124921). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6124921

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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