The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 26, 2000
Filed:
Oct. 06, 1998
Alexander S Kreizman, Beechurst, NY (US);
Kenneth F Defrietas, Patterson, NY (US);
Trex Medical Corporation, Danbury, CT (US);
Abstract
Several embodiments of a temperature gradient sensing probe formed from a printed circuit thermocouple array are disclosed. The printed circuit thermocouple array is formed by an electrically insulative sheet having a first surface, a second surface and N electrically conductive junctions passing through the sheet from the first surface to the second surface, wherein N is an integer greater than one. N electrically conductive paths formed from a first conductive material are applied to the first surface, wherein each of the N conductive paths formed from the first conductive material have a junction end electrically connected respectively to one of the N conductive junctions and a connector end for electrical connection to a signal transmission conduit. N electrically conductive paths formed from a second conductive material, dissimilar to the first electrically conductive material are also provided. The N conductive paths formed of the second material have a junction end electrically connected to one of the N conductive junctions and a connector end for electrical connection to a signal transmission conduit. The array may be applied to a shaft or disposed within a tube to form the probe. The N conductive paths formed of a second material may be replaced by a single, common conductive path formed of the second material which is connected to the conductive junctions. A panel connector for the probe is also disclosed.