The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2000
Filed:
Aug. 27, 1993
Dara T Khani, Marietta, GA (US);
Martin Marietta Corporation, Bethesda, MD (US);
Abstract
A method for analyzing a region of interest in an original image to extract at least one robust feature, including the steps of passing signals representing the original image through a first filter to obtain signals representing a smoothed image, performing a profile analysis on the signals representing the smoothed image to determine a signal representing a size value for any feature in the original image, performing a cluster analysis on the signals representing the size values determined by the profile analysis to determine a signal representing a most frequently occurring size, selecting an optimal filter based on the determined signal representing the most frequently occurring size, and passing the signals representing the original image through the optimal filter to obtain an optimally filtered image having an optimally high signal-to-noise ratio. An apparatus for analyzing a region of interest in an image to extract robust features is also provided.