The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2000

Filed:

Aug. 24, 1995
Applicant:
Inventors:

Franz W Leberl, Graz, AT;

Christian Jorde, Graz, AT;

Michael Gruber, Graz, AT;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358474 ; 358487 ; 358488 ; 358494 ; 358497 ; 356400 ; 2502081 ;
Abstract

A system for scanning and digitizing large images using a reseau for accuracy without obscuring the image to be scanned. The system uses two separate CCD photoreceptor arrays which are fixed in a rigid position with respect to each other and any accompany lenses and mirrors. In one embodiment, a first CCD photoreceptor array is used to scan the image while the second CCD photoreceptor array simultaneously scans the reseau. In a second embodiment, a single CCD photoreceptor array is used to first scan the reseau and then to scan the image. One illumination source illuminates the reseau while second illumination source illuminates the image. The arrangement of the lens(es) and the photoreceptor arrays allows the determination of any displacement of the scanner along the X-axis, Y-axis, and Z-axis, as well as the determination of any rotation of the scanner around the X-axis, Y-axis, or Z-axis. The position and attitude of the scanner, as determined by scanning the reseau, is used to correct any errors in the resulting image that are caused by displacement or rotation of the scanner. A large image can be scanned in separate but overlapping swaths, the overlap being used to align the swaths to create a final seamless digital image from the assembled swaths.


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