The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2000

Filed:

Oct. 15, 1997
Applicant:
Inventors:

Kunio Yamada, Nakai-Machi, JP;

Atsushi Ogihara, Nakai-Machi, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
358446 ; 358406 ; 358468 ; 358504 ; 399 38 ; 399 72 ;
Abstract

According to this invention, a controlled image quality is obtained without adjustment with respect to a short range of environmental changes in temperature, humidity and the like, and feedback control is easily performed for controlled variables over a long range to cope with changes with time, and the like. In the two-component non-contact development, the image density becomes stable irrespective of any environmental changes in temperature, humidity and the like when the developing bias AC voltage in the developer unit is a predetermined value. At the same developing bias AC voltage, when the rotating speed of the development roll is changed, the image density varies While making the developing bias AC voltage and the development roller rotating speed variable at the same time, a reference pattern is prepared on a banner sheet to measure the image density with an optical sensor. From the measured results, the stable value for the developing bias AC voltage is determined, and further the rotating speed of the development roller at which desired image quality density is attained, is determined.


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