The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2000
Filed:
Jul. 01, 1997
Irwin Wunderman, Mountain View, CA (US);
Adolph E Smith, Santa Cruz, CA (US);
Vijay K Lumba, San Jose, CA (US);
Other;
Abstract
An apparatus for photometric analysis and/or identification of properties of a material object comprises a collection of light sources having substantially distinct wavelength envelopes and activated in a rapid sequence of distinct combinations. The apparatus comprises a collection of spatially distributed light detectors which detect radiation from the object and produce detected signals. A signal processor for controlling the light sources and analyzing the detected signals synchronizes the detected signals with the activation of the sequence of distinct combinations of the light sources to produce associated combinations of detected signals which are then analyzed to determine a physical property of the object and/or compared for similarity to previously detected signals from known objects. The photometric data may be combined and correlated with other measured data to enhance identification.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile