The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2000
Filed:
Nov. 30, 1998
Ho-Sung Song, Kyunggi-do, KR;
Ki-Jong Lee, Seoul, KR;
Samsung Electronics Co., , KR;
Abstract
Integrated circuit regions are formed on an integrated circuit wafer. The integrated circuit wafer includes scribe regions located between the integrated circuit regions, the scribe regions include test pads that are electrically connected to the test circuits of integrated circuit regions via conductive lines. Test functions are provided to the test circuits in the integrated circuit regions via the test pads to determine the operability of the integrated circuit regions. The integrated circuit regions are separated from the plurality of scribe regions and the plurality of test pads located therein. Separating the integrated circuit regions from the scribe regions and the test pads, thereby may allow a reduction in the number of pads in the integrated circuits and a corresponding decrease in the size of respective integrated circuit packages.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile