The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2000

Filed:

Feb. 19, 1998
Applicant:
Inventors:

Noritomo Hirayama, Tokyo, JP;

Satoru Sakaue, Tokyo, JP;

Masahiro Uno, Tokyo, JP;

Yosheyuki Sekine, Tokyo, JP;

Assignee:

Fuji Electric Co., Ltd., Kawasaki, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
250343 ; 250351 ;
Abstract

An infrared gas analyzer is formed of a source of infrared rays for emitting infrared flux; an infrared flux interrupting device for chopping the emitted infrared flux from the source of the infrared rays; a condensing optical system for obtaining a predetermined solid angle in the emitted infrared flux to thereby form a condensed flux; and a multi-reflection cell disposed at an outlet of the condensing optical system, to which the condensed flux is supplied and a gas to be measured is fed. The multi-reflection cell has a multi-reflection optical system formed of a plurality of concave mirrors. The analyzer also includes an infrared level detector for detecting an amount of infrared rays with a wavelength band absorbed by a component gas to be analyzed and contained in the infrared rays emitted by the multi-reflection cell. At least the condensing optical system, multi-reflection cell and infrared level detector are accurately positioned by using as a reference a position of the condensing optical system at which the condensed flux is emitted, and are coupled tightly at coupling positions without an air-flowing layer. Accordingly, the infrared gas analyzer can be made small to detect and analyze a low density component gas and for an explosion-proof environment.


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