The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2000
Filed:
Aug. 29, 1997
Applicant:
Inventor:
Chi-Neng Arthur Han, Philadelphia, PA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
436 95 ; 436 46 ; 436 93 ; 436 94 ; 436166 ; 436169 ; 436172 ; 422 56 ; 422 8208 ; 422 8209 ;
Abstract
The present invention is directed to an improved analyte systems which are able to compensate for interfering signals and to provide accurate detection and/or quantification of analytes in a sample. In particular, the invention describes new methods, systems, and devices for indirectly determining the presence of one or more analytes in a multi-component medium.
Han, Chi-Neng. (2000). Analyte detection systems (U.S. Patent No. 6121050). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6121050
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile