The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 19, 2000
Filed:
Sep. 21, 1998
Ephraim Suhir, Randolph, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A method, technique, and apparatus proof test an optical fiber interconnect by applying an ends off-set stress on the optical fiber until the optical fiber fails or breaks, either immediately (short-term strength), or as a result of the delayed-fracture/'static-fatigue' phenomenon for the given off-set, and, hence, for the given stress (long-term strength), imposed for the measured period of time. If, for instance, the short-term strength is addressed, the off-set is measured at the time of the failure, and the corresponding critical strain of the optical fiber is then predicted. In predicting the critical strain, the method and apparatus iteratively determine the total strain, including non-linear components thereof, for an optical fiber interconnect experiencing the measured ends off-set. The analytical model/method includes the steps of iteratively processing characteristic parameters associated with the optical fiber, and determining the non-linear strain associated with the optical fiber. The apparatus includes a processor for implementing the disclosed method.