The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 19, 2000

Filed:

Aug. 31, 1998
Applicant:
Inventors:

Melanie Carasso, Chatham, NJ (US);

Sanjay Patel, New Providence, NJ (US);

Jorge Luis Valdes, Branchburg, NJ (US);

Christopher Alan White, Basking Ridge, NJ (US);

Assignee:

Lucent Technologies Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ; G01N / ;
U.S. Cl.
CPC ...
73 6175 ; 73 2402 ; 73 2403 ; 356437 ; 356438 ; 356441 ; 356442 ;
Abstract

The invention provides an improved process for determining the characteristics of dispersed particles. The process involves directing waves (acoustic or light) into a dispersion, and measuring the attenuation of the waves for particular frequencies to provide an attenuation spectrum. The measured attenuation spectrum is then compared to a set of theory-based calculated attenuation spectra to determine the particle size distribution corresponding to the measured attenuation spectrum. Unlike previous processes, the particle size distribution is capable of being accurately determined by a single inversion algorithm, thus eliminating burdensome steps of previous methods.


Find Patent Forward Citations

Loading…