The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2000
Filed:
Jun. 09, 1998
Kenneth C Gross, Bolingbrook, IL (US);
Ralph M Singer, Naperville, IL (US);
Rollin G Van Alstine, Lecanto, FL (US);
Stephan W Wegerich, Glendale Heights, IL (US);
Yong Yue, Chicago, IL (US);
ARCH Development Corporation, Chicago, IL (US);
Abstract
A method and system for monitoring a process and determining its condition. Initial data is sensed, a first set of virtual data is produced by applying a system state analyzation to the initial data, a second set of virtual data is produced by applying a neural network analyzation to the initial data and a parity space analyzation is applied to the first and second set of virtual data and also to the initial data to provide a parity space decision about the condition of the process. A logic test can further be applied to produce a further system decision about the state of the process.