The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2000
Filed:
Nov. 26, 1997
Jeffrey Dean, Menlo Park, CA (US);
James E Hicks, Newton, MA (US);
Stephen C Root, Westborough, MA (US);
Carl A Waldspurger, Atherton, CA (US);
William E Weihl, San Francisco, CA (US);
Digital Equipment Corporation, Houston, TX (US);
Abstract
Provided is a method for estimating statistics of properties of interactions among instructions processed in a pipeline of a computer system, the pipeline having a plurality of processing stages. Instructions are fetched into a first stage of the pipeline. A set of instructions are randomly selected from the fetched instructions, a subset of the set of selected instructions concurrently executing with each other. A distances between the set of selected instructions is specified, and state information of the computer system is recorded while the set of selected instructions is being processed by the pipeline. The recorded state information is communicated to software where it is statistically analyzed for a plurality of sets of selected instructions to estimate statistics of the interactions among sets of selected instructions.