The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2000
Filed:
May. 21, 1998
Wilhelmus J Welters, Eindhoven, NL;
Edward W Young, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
X-ray examination apparatus including a filter An X-ray examination apparatus (1) includes an X-ray source (2), an X-ray detector (5) and an X-ray filter (6). The X-ray filter (6) is arranged between the X-ray source and the X-ray detector. The X-ray filter (6) includes a plurality of filter elements (7) whose X-ray absorptivity can be adjusted by adjusting a quantity of X-ray absorbing liquid (30) present in individual filter elements (7). The filter elements are formed by substantially parallel plates (8), respective plates being provided with separating members (10) which project approximately transversely from the plane of such a plate. The filter elements are formed notably by parallel corrugated plates or by parallel plates provided with partitions extending transversely from the plates.