The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2000
Filed:
May. 18, 1999
Oleg Bouevitch, Gloucester, Ontario, CA;
Paul Colbourne, Nepean, Ontario, CA;
Other;
Abstract
A reference system for an optical wavelength scanner, used for measuring wavelengths of radiation from an optical device. The system utilizes a wavelength reference comprising a fixed fiber Fabry-Perot (FFP) filter in combination with a reference fiber Bragg grating (FBG) having an accurately known reflection wavelength to minimize the effects of drift and non-linearities in the scanner and to allow a simple flexure element to be used to position a dispersive grating. The wavelengths of the reference comb of the fixed FFP are determined by reference to that of the reference FBG. Then, the peaks or notches in the light intensity from the device under test are located with respect to the comb of peaks produced by the reference. In a most simple embodiment two ports are coupled so as to provide their output light to the dispersive element simultaneously and only a single collimating lens is required for collimating light from the output ports.