The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 12, 2000

Filed:

Jul. 30, 1997
Applicant:
Inventors:

John E Field, Santa Cruz, CA (US);

Stephanie J Oberg, Sunnyvale, CA (US);

Assignee:
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324529 ; 324537 ;
Abstract

A probability analysis technique is performed on magnetically obtained current data to detect short circuit defects in a plate structure (10) in which a group of first electrical conductors (32) are nominally electrically insulated from and cross a group of second electrical conductors (48). In particular, a magnetic current-sensing operation is performed on at least part of the conductors to produce current data indicative of how much, if any, current flows through each of at least part of the conductors. A short circuit defect probability analysis is then applied to the current data in order to select a location where one of the first conductors crosses one of the second conductors as being most probable of having a short circuit defect.


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