The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 12, 2000
Filed:
Jun. 10, 1999
Yukihiko Kanazawa, Kanagawa, JP;
Shinzo Kishimoto, Kanagawa, JP;
Jun Okamoto, Kanagawa, JP;
Yoshio Ishii, Kanagawa, JP;
Yoshihiro Fujita, Kanagawa, JP;
Fuji Photo Film Co., Ltd., Kanagawa, JP;
Abstract
The state of a photosensitive material processing solution is easily determined from values of multi-dimensional analysis by utilizing Mahalanobis distance. The Mahalanobis distance is calculated, and a determination is made as to whether or not the Mahalanobis distance is greater than or equal to a threshold value. If the Mahalanobis distance is less than the threshold value, the processing solution is determined to be normal, the Mahalanobis distance is displayed on a display unit, and a determination is made as to whether or not the number of sets m of normal values has become greater than or equal to a predetermined value m.sub.0. If m.gtoreq.m.sub.0, data of the characteristic values in the oldest set in a time series is deleted, and a set of data of newly detected characteristic values is added to calculate the Mahalanobis distance and update a database. If the Mahalanobis distance is greater than or equal to the predetermined value, a developing solution is determined to have become abnormal, the degree of abnormality is displayed, factors which caused the abnormality are determined, a corrective measure is determined on the basis of a combination pattern of factors, and the measure is displayed.