The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2000
Filed:
Jun. 28, 1996
Shinya Sonoda, Kyoto, JP;
Masahiro Akagi, Kyoto, JP;
Kouichi Ohmae, Kyoto, JP;
Masahito Yanagida, Kyoto, JP;
Masahiro Senga, Kyoto, JP;
Omron Corporation, Kyoto, JP;
Abstract
A method and apparatus to detect marks of a specified shape and color on a document and to extract a specified pattern consisting of a number of these marks. An RGB color signal is sent, color by color, by way of image input unit 12 to binary processing unit 13. If the marks are yellow, the B signal for the pixels constituting the marks will be smaller than the other signals. The B signal is sent to mark shape extraction unit 13a and threshold processing is executed. Simultaneously, R, G and B are sent to mark color extraction unit 13b, and the fact that the marks are yellow is detected. AND element 13c finds the logical product of these processes, and a binary image is generated from which only the yellow pixels have been extracted. This binary image is transmitted to mark location detection unit 15 by way of storage unit 14. The shapes of the marks are matched against reference data and location data are extracted for the marks. The location data are transmitted to pattern location matching unit 17 by way of storage unit 16. The goodness of fit representing whether the marks are in specified locations is obtained and output.