The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2000
Filed:
Nov. 16, 1998
Applicant:
Inventors:
Pierre H Brodeur, Smyrna, GA (US);
Emmanuel F Lafond, Atlanta, GA (US);
Assignee:
Institute of Paper Science and Technology, Atlanta, GA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01B / ;
U.S. Cl.
CPC ...
356357 ; 356432 ;
Abstract
An apparatus and method for non-contact measurement of ultrasonic waves on moving paper webs employs a photorefractive interferometer. The photorefractive interferometer employs an optical head in which the incident beam and reflected beam are coaxial, thus enabling detection of both in-plane and out-of-plane waves with a single apparatus. The incident beam and reference beams are focused into a line enabling greater power to be used without damaging the paper.