The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Sep. 05, 2000

Filed:

Jan. 16, 1998
Applicant:
Inventors:

Jung Young Son, Seoul, KR;

Sergey A Shestak, Seoul, KR;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348 46 ; 348 49 ; 359462 ;
Abstract

A multiview three-dimensional imaging system includes a large-aperture objective for focusing multiview image rays of an object incident from multiple viewing directions into a convergent zone; a scanner for scanning the focused multiview image rays at the convergent zone; and a sensor and a display for the scanned image rays. The scanner segments the focused multiview image rays into two-dimensional images from each of the multiple viewing directions. The multiview three-dimensional imaging system enables image formation with minimal light loss and image enlargement, so that a screen of arbitrary size can be employed to display the images.


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