The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Sep. 05, 2000
Filed:
Nov. 22, 1999
Scott Juds, Everett, WA (US);
Dave Dauterman, Bothell, WA (US);
IDX, Inc., El Dorado, AR (US);
Abstract
A token for use with a token operated device includes a plurality of predetermined optical characteristics. The plurality of predetermined optical characteristics are disposed in a substantially radially symmetrical manner with respect to the token, and each of the optical characteristics have the property of a facet wherein an effective surface normal of said facet is a line along a predetermined vector angle with an elevational angle ranging preferably between 30.degree. and 60.degree.. An azimuthal angle of the facet surface is other than substantially along a radial line of the token or substantially along a line tangent to an annular ring centered on the token such that a token operated device can validate the predetermined optical characteristics substantially independent of token orientation. A token testing apparatus includes a chute defined by a field adjustable pair of spaced token edge guides spaced a predetermined distance from each other such that each token passing through the chute is sensed along its center.