The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2000
Filed:
Mar. 10, 1998
Allan Parker, Austin, TX (US);
Joseph C Skrovan, Buda, TX (US);
Advanced Micro Devices, Inc., Sunnyvale, CA (US);
Abstract
A method is presented for generating functional tests for a microprocessor having several operating modes and features. A test module template file includes a basic set of instructions required to configure the microprocessor to operate in any one of the several operating modes and with any of the several features enabled. A user modifies a copy of the test module template file to form a test module file which provides a desired operating environment and causes the microprocessor to perform a desired activity and to produce a test result. An assembler takes as input the test module file, along with the contents of any library files to be included, and produces both an assembly code list file and a test code file. The assembly code list file is a computer program listing containing assembly language instructions and data. The test code file is intended for execution by: (i) a model of the microprocessor existing within a simulation system, or (ii) a hardware implementation of the microprocessor residing within a computer system. The user specifies at execution time the operating mode of the microprocessor and any features to be enabled via a command line. An expected test result of the desired activity is derived from a functional specification of the microprocessor. The test result is compared to the expected test result in order to determine proper operation of the microprocessor.