The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2000

Filed:

Jul. 02, 1998
Applicant:
Inventors:

Willem P Van Der Brug, Eindhoven, NL;

Paulus M Gieles, Eindhoven, NL;

Adrianus J Dankers, Eindhoven, NL;

Jacobus G Van Den Goor, Eindhoven, NL;

Assignee:

U.S. Philips Corporation, New York, NY (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600427 ; 606130 ;
Abstract

An image-guided surgery system includes a position measuring system (9, 10) for measuring a position of an instrument (20). The image-guided surgery system includes a test system (9, 10, 30) which is arranged to measure the instrument, using the position measuring system, by measuring a calibration position of a reference part (42) of the instrument while an object part (23) of the instrument is situated in a calibration location. The test system is also arranged to measure a test position of the reference part of the instrument while the object part of the instrument is situated in a test position.


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