The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 29, 2000

Filed:

Aug. 26, 1998
Applicant:
Inventor:

Yasushi Adachi, Nara, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382176 ; 382175 ;
Abstract

A first feature parameter calculating circuit outputs, as a variable of a first feature parameter, a difference between a maximum value and a minimum value of signal levels of pixels calculated in a local block having a target pixel at a center. A second feature parameter calculating circuit determines sums of differences in signal level in the local block, along a direction in which the pixels are arranged, and outputs, as a variable of a second feature parameter, a minimum value of the sums. A third feature parameter calculating circuit binarizes the pixels in the local block, and counts the number of succeedingly arranged pixels having equal density, for example, along a main scanning direction, and calculates a difference between a maximum value and a minimum value of the numbers counted. In the same manner, a difference is also calculated along a sub scanning direction, and larger of two differences is outputted as a variable of a third feature parameter. A judging circuit categorizes each variable multi-dimensionally so as to discriminate a region including the target pixel.


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