The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2000
Filed:
Mar. 14, 1997
Thomas Hazlett, Cambridge, MA (US);
XRF Corporation, Somerville, MA (US);
Abstract
Disclosed is a scanning x-ray fluorescence spectrometer for measuring accurately the content of a randomly distributed element contained in a sample. Said device comprising a linear excitation source of radioactive material in a holder which produces a beam of ionizing radiation capable of exciting the emission of primary x-rays of the said element from said sample. The sample is mechanically drawn through said beam in a direction perpendicular to the axis of said source, thus exposing the entire sample to a uniform radiation flux. A linear radiation detector is positioned on a plane parallel to said sample and said source, positioned such that its sensitive area faces said sample at the point where the most intense portion of said beam passes through said sample, thus achieving a uniform collection of x-rays from the sample. A personal computer provides calibration, motor control and data analysis capability including an algorithm to convert nuclear data into an accurate reading of the concentration of the element in the sample.