The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2000
Filed:
Sep. 24, 1998
Richard K DeFreez, Azalea, OR (US);
Kenneth L Girvin, Grants Pass, OR (US);
Frederic C Schildmeyer, Grants Pass, OR (US);
Pacific Scientific Instruments Company, Grants Pass, OR (US);
Abstract
A particle counter (10) passes a sample stream of a carrier gas or fluid containing particles (72) through an elongated, flattened nozzle (16) and into a view volume (18) formed by an intersection of the sample stream and a laser beam (13). Particles entrained in the sample stream scatter light rays while passing through the view volume. The scattered light is collected by an optical system (26) and focused on to a detector (40). The magnitude of signal coming from the detector is indicative of the particle size. To correct for variances in particle velocity and light beam intensity across the view volume, flow aperturing is used. Flow aperture modeling (Eqs. 1-7) provides a format for designing the nozzle such that the lateral velocity profile matches the laser beam lateral intensity profile, thereby providing uniform detection sensitivity to laser light scattered from monodisperse particles distributed laterally across the view volume. Uniform detection sensitivity of monodisperse particles provides accurate particle sizing resolution.