The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2000
Filed:
Mar. 23, 1998
Applicant:
Inventors:
Anadi Mukherjee, Albuquerque, NM (US);
Nandini Mukherjee, Albuquerque, NM (US);
Conrad S Sarvis, Albuquerque, NM (US);
Bruce A Reinhardt, Tipp City, OH (US);
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356317 ; 356318 ; 2504581 ; 2504591 ; 2504611 ; 2504612 ;
Abstract
The purpose of the nonlinear spectrophotometer is to provide a simple instrument that can be used on a routine basis to accurately measure the two-photon absorption (TPA) coefficient and cross-section on a wide variety of materials. The instrument is capable of measuring: (1) both organic and inorganic materials, (2) solutions and thin film materials forms, and (3) materials which are fluorescent and nonfluorescent.