The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2000
Filed:
Aug. 21, 1998
Mau-Song Chou, Rancho Palos Verdes, CA (US);
Richard A Chodzko, Rancho Palos Verdes, CA (US);
TRW Inc., Redondo Beach, CA (US);
Abstract
A method and apparatus for inspection of a substrate and a cover glass covering the substrate provides consistent detection of defects in the substrate such as cracks and cracks in the cover glass free of visual inspection of the substrate and the cover glass. An electromagnetic radiating source produces infrared radiation which illuminates the substrate and cover glass at a predetermined azimuth angle. The azimuth angle is varied such that the substrate and cover glass are illuminated at a plurality of azimuth angles. The substrate and the cover glass reflect portions of the incident electromagnetic radiation. A radiation detector collects portions of the reflected radiation and creates a plurality of images therefrom which include indicia representative of the defect in the substrate and the crack in the cover glass.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile