The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 29, 2000
Filed:
Oct. 30, 1998
John Angus Foster, Colorado Springs, CO (US);
Michael L Beyers, Colorado Springs, CO (US);
Agilent Technologies, Palo Alto, CA (US);
Abstract
A digital oscilloscope automatically selects as the initial instance of a waveform parameter to be measured the instance that is both visible in the displayed trace and closest to the trigger reference point. Such a manner of automatic selection allows a greater amount of panning and zooming while the 'scope is subsequently stopped, without causing a different instance to become the measured instance, and also reduces confusion about continuity of measurement while the display is altered with the 'scope is still running. This automatically selected choice can still be overridden, if desired, by a manual selection. A further refinement is to, once an instance is automatically selected, retain it as the selected instance as long as it remains visible as part of a modified displayed trace, even if it would not otherwise become the selected initial instance if the measurement activity were first initiated with that modified trace. Still another refinement is to alert the operator that, owing to the previously automatically selected instance having been panned or zoomed off screen, a new and different automatically selected instance is now being measured.