The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2000
Filed:
May. 29, 1998
Garry Didinsky, Niles, IL (US);
Yeong-Wei Wu, Rancho Palos Verdes, CA (US);
Rongsheng Li, Hacienda Heights, CA (US);
Arunkumar Nayak, Van Nuys, CA (US);
Douglas Hein, Los Angeles, CA (US);
Hughes Electronics Corporation, El Segundo, CA (US);
Abstract
A method and apparatus for autonomous acquisition of attitude in a stellar inertial spacecraft attitude system is disclosed. The present invention uses star trackers, an on-board star catalog, spacecraft steering and inertial sensors to determine spacecraft attitude. The present invention utilizes pattern match and pattern rejection methods and uses multiple stellar snap-shots in conjunction with spacecraft steering and spacecraft inertial measurements to acquire spacecraft attitude. Spacecraft inertial measurements are used to connect multiple stellar snap-shots to provide adequate star information that can be used to acquire spacecraft attitude. In an attitude determination system using star trackers, the star trackers may have a narrow field-of-view or few stars may be available for viewing. The present invention uses pattern matching and pattern rejection on different sets of stars, thereby allowing attitude acquisition when the number of stars in view is small.