The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 22, 2000

Filed:

Dec. 31, 1997
Applicant:
Inventor:

John Minkoff, Englewood, NJ (US);

Assignee:

Lucent Technologies, Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
H04Q / ;
U.S. Cl.
CPC ...
455561 ; 455562 ; 34235708 ; 34235712 ;
Abstract

A technique for interference rejection at a sensor array is disclosed that employs a transformation on the output of the sensor array wherein the angular location of the source of each interfering signal constitutes the null-space of the transformation. For a sensor array of M sensor elements, the rejection of up to M-1 interferers is possible with a single transformation. One embodiment of the present invention comprises: receiving M signals, x.sub.0 (t) through x.sub.M-1 (t), at a frequency of .omega. radians/second at a sensor array comprising M spatially-disparate sensor elements, x.sub.0 through x.sub.M-1, wherein the M signals, x.sub.0 (t) through x.sub.M-1 (t), comprise a signal of interest incident on the sensor array at an angle .phi., and an interfering signal incident on the sensor array at an angle .psi..sub.1 ; transforming each of the M signals, x.sub.0 (t) through x.sub.M-1 (t), by a first factor based on .omega., .psi..sub.1, the speed of propagation of the interfering signal, and the distance between the sensor elements, x.sub.0 through x.sub.M-1, to form M intermediate products s'.sub.1 (t) through s'.sub.M-1 (t); and transforming each of the M intermediate products s'.sub.1 (t) through s'.sub.M-1 (t) by a second factor based on .omega., .PHI., .psi..sub.1, the speed of propagation of the interfering signal, and the distance between the sensor elements, x.sub.0 through x.sub.M-1, to form M signals s.sub.1 (t) through s.sub.M-1 (t).


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