The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2000
Filed:
Apr. 30, 1997
Applicant:
Inventors:
Joseph William Kearney, Palmer, PA (US);
Daniel M Wroge, Orlando, FL (US);
Assignee:
Lucent Technologies Inc., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
324765 ;
Abstract
A test structure and test fixture which are capable of measuring time dependent dielectric breakdown under accelerated temperature test conditions which can extend to 300.degree. C. The test structure is a parallel plate configuration with metal electrodes which is insensitive to polarity. The test fixture employs a ceramic or polymide body which remains rigid and well isolated electrically under these test conditions
Kearney, Joseph. (2000). Test apparatus for time dependent dielectric breakdown (U.S. Patent No. 6107816). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6107816
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile