The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2000
Filed:
Feb. 23, 1996
Wolfgang Nikutta, Munchen, DE;
Hartmut Schmokel, Ottobrunn, DE;
Gunther Kuchinke, Neubiberg, DE;
Thomas von der Ropp, Germering, DE;
Rudolph Walter, Shelburne, VT (US);
Infineon Technologies AG, Munich, DE;
Abstract
An apparatus for function testing of electronic circuits includes a tester array having a terminal. A test circuit has at least two resistor elements, a common circuit node connected to the resistor elements for connection to the terminal of the tester array, and terminals of the resistor elements each being remote from the circuit node for connection to a respective output of an electronic circuit to be tested. A testing method for function testing of electronic circuits with such an apparatus includes placing the electronic circuit into a state in which signals are present at an output of the electronic circuit to be tested. The electronic circuit is function tested with respect to a resultant signal being established at the common circuit node.