The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2000
Filed:
Dec. 18, 1997
John Andrew Ryals, Cary, NC (US);
Scott Joseph Uknes, Apex, NC (US);
Eric Russell Ward, Durham, NC (US);
Terrence Patrick Delaney, Ithaca, NY (US);
Kay Ann Lawton, Raleigh, NC (US);
Kristianna Baldwin Weymann, Portland, OR (US);
Henry-York Steiner, Apex, NC (US);
Klaus Maleck, Durham, NC (US);
Novartis Finance Corporation, New York, NY (US);
Abstract
Methods are provided for selecting parental plants exhibiting disease resistance and for using these plants in breeding programs. In one method of the invention, constitutive immunity (cim) mutants are screened for either resistance to a pathogen of interest or for the expression of systemic acquired resistance (SAR) genes. Such mutants having the desired traits or expressing the desired genes are then used in breeding programs. Parent plants can also be selected based on the constitutive expression of SAR genes. These mutants are phenotypically normal yet exhibit a significant level of disease resistance. Also disclosed are lesion-simulating-disease (lsd) mutants having a lesion mimic phenotype that also express SAR genes and exhibit disease resistance. Further disclosed are non-inducible immunity (nim) mutants that do not express SAR genes, even when induced by a pathogen. Methods of use for these mutants are also disclosed.