The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 22, 2000
Filed:
Apr. 23, 1999
Brian Peter Geiser, Hartland, WI (US);
William Thomas Hatfield, Schenectady, NY (US);
Vaishali Vilas Kamat, Waukesha, WI (US);
Steven Charles Miller, Pewaukee, WI (US);
Larry Y Mo, Waukesha, WI (US);
Todd Michael Tillman, West Milwaukee, WI (US);
Boris Yamrom, Schenectady, NY (US);
General Electric Company, Schenectady, NY (US);
Abstract
A method and apparatus for calculating the inter-slice spacing in a data volume and registering the slices of that volume using SAD calculations. The resulting transformed data volume is then three-dimensionally reconstructed using a projection technique. If during scanning the probe is translated in the Z direction and at the same time is shifted in the X and/or Y direction, the SAD value will be artificially high. By translating two adjacent images with respect to each other in the X direction and then in the Y direction, and searching for the minimum SAD value, the amount of shift in the X and/or Y direction can be determined and that shift can then be removed. Also by rotating two slices with respect to each other and looking for a minimum SAD value, rotational motion of the probe during scanning can be removed.