The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2000

Filed:

May. 29, 1998
Applicant:
Inventors:

Andrew A Wang, Wescosville, PA (US);

Michael J Weber, Wescosville, PA (US);

Assignee:

Lucent Technologies, Inc., Murray Hill, NJ (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ; G06F / ; H04B / ;
U.S. Cl.
CPC ...
714732 ; 710105 ; 710113 ; 710240 ; 710126 ; 714734 ; 714733 ; 714 45 ; 714736 ; 714738 ; 714 37 ; 371 224 ; 371 225 ;
Abstract

A test system resident in a highly integrated chip having a multi-bus architecture and data transfer protocols among a plurality of modules comprising a plurality of buses, each of the buses having multiple data lines for transferring data based on the data transfer protocols, a multiplexer coupled to the plurality of buses for multiplexing the data onto parallel lines and a CRC signature compactor coupled to the parallel lines for receiving the data. The CRC signature compactor compresses the data and (1) provides a fault-free signature representative of the data in a known fault-free chip, and (2) provides another signature representative of the data in a chip under test, wherein the two signatures are compared to determine whether a fault exists in the chip under test.


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