The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2000

Filed:

Mar. 30, 1998
Applicant:
Inventors:

Piero Patrone Bonissone, Schenectady, NY (US);

Yu-To Chen, Niskayuna, NY (US);

Vipin Kewal Ramani, Niskayuna, NY (US);

Rasiklal Punjalal Shah, Latham, NY (US);

John Andrew Johnson, Delafield, WI (US);

Phillip Edward Steen, Delafield, WI (US);

Ramesh Ramachandran, Niskayuna, NY (US);

Assignee:

General Electric Company, Schenectady, NY (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
714 26 ; 714 25 ; 714 26 ; 714 37 ; 706 62 ;
Abstract

The present invention discloses a system and method for diagnosing and validating a machine with waveform data generated therefrom. In this invention, historical waveform data are obtained from machines having known faults along with corresponding actions for repairing the machines and are used to develop fault classification rules. The fault classification rules are stored in a diagnostic knowledge database. The database of classification rules are used to diagnose new waveform data from a machine having an unknown fault.


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