The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2000

Filed:

Oct. 03, 1997
Applicant:
Inventors:

Yutaka Tsuchiya, Hamamatsu, JP;

Yutaka Yamashita, Hamamatsu, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
600476 ; 356432 ; 356433 ;
Abstract

A measuring apparatus of absorption information of scattering medium, comprising a light source for generating pulsed light, a light incidence section for making the pulsed light incident to a scattering medium, a light receiving section for receiving the light having propagated inside the measured object, a signal detecting section for temporally cutting a portion out of a light signal obtained by the light receiving section to acquire a measurement signal corresponding to the cut-out signal, a first arithmetic section for performing a measurement for acquiring measurement signals respectively at plural different timings or the like and for deriving a time integration value and a mean optical pathlength for each of the plural measurement signals obtained, and a second arithmetic section for calculating a change amount of concentration of an absorptive constituent, based on a predetermined relation among plural time integration values, plural mean optical pathlengths, an absorption coefficient per unit concentration of the absorptive constituent, and the change amount of concentration of the absorptive constituent.


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