The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 15, 2000

Filed:

Jul. 28, 1998
Applicant:
Inventor:

Shiro Oikawa, Shiga, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ; G01N / ;
U.S. Cl.
CPC ...
378 22 ; 378-4 ; 378 10 ; 378 19 ; 378 20 ; 378 21 ; 378 57 ;
Abstract

A nondestructive test apparatus for testing a work is formed of a fixed radiation generating device; a rotatable work holding device situated near the radiation generating device; and a rotatable radiation image taking device situated near the work holding device at a side opposite to the radiation generating device. The radiation image taking device rotates or swings in accordance with rotation or swinging of the work holding device at a same angle thereto. The radiation image taking device receives and accumulates images of the work held on the work holding device and radiated by the radiation generating device while the work is being rotated or swung. It is possible to quickly obtain a sectional image with the relatively simple and compact structure. The test or inspection efficiency can be improved.


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