The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2000
Filed:
Oct. 29, 1998
Heang K Tuy, Chesterland, OH (US);
Picker International, Inc., Highland Heights, OH (US);
Abstract
A method of image reconstruction from wedge beam data includes collecting cone beam data in two-dimensional arrays. The collected data corresponds to rays of penetrating radiation diverging in two dimensions from a common vertex which travels along a curve. Each element of the data is related to line integrals of an object being reconstructed taken along each ray. A local coordinate system is defined having three mutually orthogonal axes and an origin at the vertex. The third axis of the local coordinate system extends in a direction tangential to the curve at the vertex. The collected data is rebinned into a wedge beam format wherein sets of parallel rays are grouped to define planes of radiation that angularly diverge from a common axis. A one-dimensional convolution of the rebinned data is computed in the local coordinate system along a direction parallel to the third axis. Finally, the convolved data is weighted and three-dimensionally backprojected. In a preferred embodiment, the curve defines a helical path, and the kernel for the one-dimensional convolution of the rebinned data is a ramp convolver.