The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2000
Filed:
Sep. 12, 1997
Kazuhiro Ohara, Richardson, TX (US);
Texas Instruments Incorporated, Dallas, TX (US);
Abstract
A method of measuring the motion in video image data for a pixel which uses both field-difference and frame-difference motion values to generate a motion value having increased accuracy. Image data (806) from the same pixel in a prior row of the same field (906) is compared to image data (808) from the same pixel in the prior row of the prior frame (908), and the absolute value of the difference is compared to the absolute value of the difference in image data (802) from the same pixel in a following row of the same field (902) and image data (804) from the same pixel in the following line of the prior frame (904). The minimum of these two values is the minimum frame-difference motion value which is input into a logical mixer. Also input into the logical mixer is the minimum field-difference motion value which may be determined by comparing data (802, 806) from the same pixel of an adjacent line of the same field (902, 906) with image data (810) from the same pixel of the same line of the prior field. The average of image data (810) from the same pixel of the same line of the prior field and image data (812, 814) from the same pixel of two rows prior or two rows after of the prior field (912, 914) may be used instead of image data (810) from the same pixel of the same line of the prior field alone, to increase the accuracy of the measurement.