The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2000
Filed:
Mar. 20, 1998
Ryohei Nagata, Shinjuku-ku, JP;
Hiroyuki Nakamura, Shinjuku-ku, JP;
Abstract
A measuring chip for an optical analyzer includes a translucent or transparent substrate 1, and a sample solution chamber S formed on a sulface of the translucent or transparent substrate 1. The sample solution chamber S has an inlet S.sub.1 for introducing a sample solution to be analyzed, and an outlet S.sub.2 for discharging the analyzed sample solution. The sample solution chamber S is formed so as to be filled with the sample solution between the inlet S.sub.1 and the vicinity of the outlet S.sub.2 by the capillary phenomenon. On the translucent or transparent substrate 1, an analyzing region 10 is formed by stacking a metal thin film 2 and an immobilizing film 3 for immobilizing a physiologically active substance 4. On the analyzing region 10, the sample solution chamber S is formed to obtain a measuring chip for an optical analyzer particularly utilizing the surface plasmon resonance (SPR). Thus. it, is possible to obtain a measuring chip for an optical analyzer, which can be easily handled and which can carry out an analysis using a small quantity of sample solution.