The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2000
Filed:
Jan. 06, 1999
Ronald M Rudish, Commack, NY (US);
Edward Magill, Brooklyn, NY (US);
AIL Systems Inc., Deer Park, NY (US);
Abstract
An antenna and system for determining two-dimensional angle-of-arrival includes circular array interferometers for azimuth, linear interferometers for elevation, and a mast for positioning the interferometers in a vertically stacked orientation. The circular array interferometers exhibit azimuth constant-phase-difference contours orthogonal to elevation constant-phase-difference contours exhibited by the linear interferometers. An antenna and system for determining azimuth of input signals includes ambiguous and non-ambiguous circular array interferometers. The non-ambiguous circular array interferometer resolves ambiguities introduced by the ambiguous circular array interferometer, the at least one ambiguous circular array interferometer operatively coupled to a low-order Butler matrix and power divider/combiner such that a high order Butler matrix is not required to generate omnidirectional phase modes from the ambiguous circular array interferometer. A method for determining phase differences indicative of two-dimensional angle-of-arrival includes determining a first phase difference indicating azimuth using circular array interferometers, determining a second phase difference indicating elevation using linear interferometers, and orienting the interferometers in a vertically stacked orientation such that the azimuth constant-phase-difference contours are orthogonal to the elevation constant-phase-difference contours. A method for determining phase difference representative of azimuth includes determining a phase difference indicative of azimuth using ambiguous circular array interferometer and non-ambiguous circular array interferometers, and resolving ambiguities in azimuth introduced by the ambiguous circular array interferometer using the non-ambiguous circular array interferometer, the at least one ambiguous circular array interferometer operatively coupled to a low-order Butler matrix and power divider/combiner such that a high order Butler matrix is not required to generate omnidirectional phase modes from the ambiguous circular array interferometer. A method for determination of polarization of input signals with only one added element.