The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2000
Filed:
Oct. 06, 1998
Applicant:
Inventors:
Luc Beauvillier, Richardson, TX (US);
Michael John Brady, Brewster, NY (US);
Dah-Weih Duan, Yorktown Heights, NY (US);
Daniel J Friedman, Tarrytown, NY (US);
Paul Andrew Moskowitz, Yorktown Heights, NY (US);
Philip Murphy, New Fairfield, CT (US);
Assignee:
Intermec IP Corp., Woodland Hills, CA (US);
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G08B / ;
U.S. Cl.
CPC ...
3405721 ; 3405725 ;
Abstract
The present invention provides a method and apparatus for testing RFID tags using wireless radio frequency (RF) communication. The method and apparatus allow RFID tags to be tested individually or in groups while they are in close proximity to each other (e.g., within the read range of the tag).