The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2000
Filed:
Oct. 13, 1998
Jonathan Darrel Coker, Rochester, MN (US);
Steven Michael Currie, Rochester, MN (US);
Richard Leo Galbraith, Rochester, MN (US);
Donald Earl Vosberg, Rochester, MN (US);
International Business Machines Corporation, Armonk, NY (US);
Abstract
A method and apparatus are provided for detecting surface defects in a direct access storage device. Disk data readback sample values are converted to gain error values based upon an identified difference from predefined ideal data values. An error signal accumulator accumulates a summed value of error signals for a current sample and a predetermined number of past samples. Each sequential accumulator summed value is compared with a predetermined threshold value. An error output is generated responsive to each sequential accumulator summed value greater than or equal to the predetermined threshold value, the error output identifying the disk surface defect.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile