The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 15, 2000
Filed:
May. 09, 1994
Applicant:
Inventors:
Orville D Means, Poway, CA (US);
Robert W LeClair, Escondido, CA (US);
David S Furuno, San Diego, CA (US);
Assignee:
Other;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ; G01N / ;
U.S. Cl.
CPC ...
2503417 ; 356237 ;
Abstract
A filter inspection system for inspecting filters comprising a support frame for supporting a substantially tubular filter having inner and outer surfaces for rotation about its axis, a source of EMR for directing radiation along one of the inner and outer surfaces of a filter, an EMR sensing unit mounted adjacent to the other of the surfaces for sensing EMR passing through the filter and generating a signal, and an indicator responsive to the signal for indicating the existence of and the location of passage of EMR through the filter.