The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Aug. 08, 2000

Filed:

Nov. 18, 1999
Applicant:
Inventors:

Jenyuan Yuan Her, Novi, MI (US);

Ming-Ran Lee, Troy, MI (US);

Poyu Tsou, Canton, MI (US);

Assignee:

Ford Global Technologies, Inc., Dearborn, MI (US);

Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
701 29 ; 701111 ; 364578 ; 73 3509 ; 73 62 ; 73 69 ; 700280 ;
Abstract

Vehicle model rattle detection method and system process vibration displacement data of elements of a vehicle CAE model to predict rattle of the vehicle. The rattle detection method and system includes dividing a vehicle model into a plurality of elements and grids. The displacement data for each element as a function of vibration is then provided. The element-grid pairs which contact due to vibration are then determined using the displacement data. Contact velocity for each contacting element-grid pair due to vibration is then estimated. Rattle for each contacting element pair as a function of contact velocity is then determined. The displacement data includes magnitude data and phase data for each element as a function of vibration over time. A rattle index for each contacting element pair is generated, the rattle index is indicative of rattle severity.


Find Patent Forward Citations

Her, Jenyuan. (2000). Vehicle rattle detection method and system (U.S. Patent No. 6101432). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/6101432

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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