The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Aug. 08, 2000
Filed:
Oct. 27, 1999
Samsung Electronics Co., Ltd., Kyungki-Do, KR;
Abstract
A developer contamination measuring apparatus of a printer includes a first pipe portion having a first gap and a second pipe portion having a second gap, a light emitting unit radiating light to the first pipe portion and the second pipe portion, a light detecting unit detecting light reflected or transmitted from the first pipe portion and the second pipe portion to output first and second light receiving signals, respectively, and a developer contamination measuring unit controlling the light emitting unit, and calculating the degree of a contamination due to mixing of other developing materials with the developer from the first and the second light receiving signals. Thus, the degree of contamination of a developer mixed with other developing materials can be precisely calculated, and the developer can be replaced, when the calculated amount of contamination exceeds a predetermined allowable contamination level, to thereby prevent deterioration of print quality.